Richard M. Silver, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ; International SEMATECH
Date
[2004]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5375
sponsored by the Pressure Vessels and Piping Division, ASME ; principal editor, Frederick W. Brust ; contributing editors, Pingsha Dong ... [and others]
Daniel J. Herr, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ; International SEMATECH
Date
[2003]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5038
Daniel J.C. Herr, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ; International SEMATECH
Date
[2002]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4689
Neal T. Sullivan, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ; International SEMATECH
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4344
Committee on Dosimetry for the Radiation Effects Research Foundation, Board on Radiation Effects Research, Division on Earth and Life Studies, National Research Council
prepared by the Railway Association of Canada in partnership with Environment Canada ; for the Transportation Systems Branch, Air Pollution Prevention Directorate, Environment Canada
Neal T. Sullivan, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International ; International SEMATECH
Date
[2000]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3998