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Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
- Author / Creator
- Conferences
- International Symposium on Laser Metrology (8th : 2005 : Merida, Ycatan, Mexico)
- Available as
- Physical
Details
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- Creator
- R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [and others] ; published by SPIE--the International Society for Optical Engineering
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- Bellingham, Wash. : SPIE, [2005]
- ©2005
- Physical Details
-
- xx, 852 pages : illustrations ; 28 cm
- ISBNs
- 9780819457578, 0819457574
- OCLC
- ocm60036157
- Includes bibliographical references and author index.