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IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society
- Available as
- Online
- Physical
Details
Checking for availability...
- Other Title
-
- T-DMR
- Format
- Journals, Magazines, Newspapers
- Language
- English
- Contributors
- Publication
-
- New York, NY : Institute of Electrical and Electronics Engineers, c2001-
- Publication Dates
- Vol. 1, no. 1 (Mar. 2001)-
- Physical Details
-
- volumes : illustrations ; 28 cm
- ISSNs
- 1530-4388, 1558-2574
- OCLC
- ocm48011789, ocm44161177
- Title from cover.
- Also available to subscribers via the World Wide Web.