Rudolf L. van Renesse, chair/editor ; sponsored by IS&T--The Society of Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
Date
[2002]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4677
sponsored by ASTM Committee F-12 on Security Systems and Equipment, American Society for Testing and Materials, Gaithersburg, Md., 4-5 April 1979 ; John Stroik, editor