Klaus P. Schäfer ... [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEDO--Sociedad Espaõla de Óptica (Spain), NASA--National Aeronautics and Space Administration (USA), EOS--European Optical Society
Date
[2004]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5571
James R. Slusser, Klaus Schäfer, Adolfo Comerón, chairs/editors ; sponsored by SPIE Europe ; cooperating organisations, NASA--National Aeronautics and Space Administration (USA), [and] EOS--European Optical Society
Date
[2006]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 6362
Eastwood Im, Song Yang, Peng Zhang, editors ; sponsored by SPIE ; cosponsored by State Key Laboratory of Remote Sensing Science (China), NASA--Nataional Aeronautics and Space Administration (United States), Ministry of Earth Sciences (India) ; cooperating organizations, Institute of Remote Sensing and Digital Earth (China) [and nine others]
Jaqueline E. Russell, Klaus Schäfer, Olga Lado-Bordowsky, chairs/editors ; sponsored by, EOS--the European Optical Society, SPIE--the International Society for Optical Engineering, NASA--National Aeronautics and Space Administration (USA) ; published by, SPIE--the International Society for Optical Engineering
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4168
Upendra N. Singh, Kohei Mizutani, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NASA--National Aeronautics and Space Administration (USA) ... [and others]
Date
[2005]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5653
Si Chee Tsay, Tatsuya Yokota, Myoung-Hwan Ahn, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NASA--National Aeronautics and Space Administration (USA) ... [and others]
Date
[2004]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5652