David C. Wilson ... [and others], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, SIAM--Society for Industrial and Applied Mathematics
Date
[2000]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4121
David M. McKeown, J. Chris McGlone, Olivier Jamet, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization International Society for Photogrammetry and Remote Sensing
Date
[1997]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3072
Anil K. Jain, Nalini K. Ratha, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Ball Aerospace & Technologies Corporation (USA) ... [and others]
Date
[2005]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5779
David P. Casasent, Ernest L. Hall, Juha Röning, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; technical cosponsor IEICE Communications Society (Japan) in cooperation with IEICE Electronics Society (Japan)
Date
[2004]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5608
David P. Casasent, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations NIST--National Institute of Standards and Technology ... [and others]
Date
[1997]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3208
David P. Casasent, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by SME--the Society of Manufacturing Engineers
Date
[1998]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3522
A. Gruen, E. Baltsavias, editors ; organized by ISPRS--International Society for Photogrammetry and Remote Sensing, Commission V, ETH--Institute of Geodesy and Photogrammetry, Swiss Federal Institute of Technology, Zurich
Date
[1990]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 1395