International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Date
1995
Series
Proceedings / SPIE--the International Society for Optical Engineering International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
International Workshop on New Approaches to High-Tech Materials: Nondestructive Testing and Computer Simulations in Materials Science and Engineering
Date
1998
Series
SPIE proceedings series International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering
hrsg. unter besonderer Mitwirkung der Staatlichen Materialprüfungsanstalten Deutschlands, der Kaiser-Wilhelm-Gesellschaft und der Industrie, sowie der Eidgenössischen Materialprüfungsanstalt, Zürich, von Erich Siebel