Edward J. Delp III, Ping Wah Wong, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
Date
[2002]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4675
Jun Tian, Tieniu Tan, Liangpei Zhang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) ... [and others] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4551
Ping Wah Wong, Edward J. Delp, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
Date
[2000]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3971
Mark S. Schmalz, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organization, Society for Industrial and Applied mathematics (SIAM)
Date
[2000]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4122
Mark S. Schmalz, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, Society for Induatrial and Applied mathematics (SIAM)
Date
[1999]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3814
Edward J. Delp III, Ping W. Wong, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
Date
[2004]
Series
Proceedings of Electronic Imaging Science and Technology
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5306