Brian D. Ramsey, Thomas A. Parnell, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, NARSIA--North American Remote Sensing Industries Association [and] ASPRS--American Society for Photogrammetry and Remote Sensing
Date
[1996]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2806
J. Christopher Dainty, Luc R. Bissonnette, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations NARSIA--North American Remote Sensing Industries Association, ASPRS--American Society for Photogrammetry and Remote Sensing
Date
[1996]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2828
David M. Rust, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, NARSIA--North American Remote Sensing Industries Association [and] ASPRS--American Society for Photogrammetry and Remote Sensing
Date
[1996]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2804
Joseph J. Santoleri, chair/editor ; sponsored by the European Optical Society (EOS), SPIE--the International Society for Optical Engineering ; in cooperation with Freie Universität Berlin
Date
[1993]
Series
Europto series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 1717
Ishwar D. Aggarwal, Stuart Farquharson, Eric Koglin, chairs/editors ; sponsored by Air & Waste Management Association, SPIE--the International Society for Optical Engineering in cooperation with U.S. Environmental Protection Agency, U.S. Department of Energy, Chemical Manufacturers Association
Date
[1995]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2367
Mike Cruise, Peter Saulson, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, International Commission for Optics ... [and others]
Date
[2003]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4856