Jun Shen, Sharatchandra Pankanti, Runsheng Wang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) ... [and others] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4554
Jayaram K. Udupa, Aaron Fenster, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) ... [and others]
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4549
Yair Censor, Mingyue Ding, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) ... [and others] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4553
Qingxi Tong, Yaoting Zhu, Zhenfu Zhu, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III ... [and others] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4548
Tianxu Zhang, Bir Bhanu, Ning Shu, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) ... [and others] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4550