Maksymilian Pluta, Mariusz Szyjer, editors ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering in association with SPIE Poland Chapter [and] State Committee for Scientific Research (Poland)
Date
[2002]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4887