Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Date
[2004]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5392
George Y. Baaklini, Carol A. Lebowitz, Eric S. Boltz, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Date
[2000]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3993
George Y. Baaklini, Carol A. Lebowitz, Eric S. Boltz, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEM--Society for Experimental Mechanics, Inc., ASNT--American Society for Nondestructive Testing, [and] ISNDI--Japanese Society for Nondestructive Testing
Date
[1999]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3585
Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by, National Institute of Standards and Technology (USA) ... [and others] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [and others] ; published by SPIE--the International Society for Optical Engineering
Date
[2003]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5045
Peter J. Shull, Andrew L. Gyekenyesi, Aftab A. Mufti, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Date
[2005]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5767