Ryszard J. Pryputniewicz, Gordon M. Brown, Werner P.O. Jüptner, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by SEM--Society for Experimental Mechanics
Date
[1995]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2545
Elena Aprile, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsoring organization, Aviation Security R&D Service, FAA Technical Center
Date
[1992]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 1734
J. Christopher Dainty, Luc R. Bissonnette, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations NARSIA--North American Remote Sensing Industries Association, ASPRS--American Society for Photogrammetry and Remote Sensing
Date
[1996]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2828
David M. Rust, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, NARSIA--North American Remote Sensing Industries Association [and] ASPRS--American Society for Photogrammetry and Remote Sensing
Date
[1996]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2804
Brian D. Ramsey, Thomas A. Parnell, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, NARSIA--North American Remote Sensing Industries Association [and] ASPRS--American Society for Photogrammetry and Remote Sensing
Date
[1996]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2806
Brian D. Corner, Joseph H. Nurre, Roy P. Pargas, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
Date
[2001]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4298