George Y. Baaklini, Carol A. Lebowitz, Eric S. Boltz, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEM--Society for Experimental Mechanics, Inc., ASNT--American Society for Nondestructive Testing, [and] ISNDI--Japanese Society for Nondestructive Testing
Date
[1999]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 3585