editors : Pierre-Yves Bely and Christopher J. Burrows, Space Telescope Science Institute [and] Garth D. Illingworth, University of California, Santa Cruz
James R. Slusser, Klaus Schäfer, Adolfo Comerón, chairs/editors ; sponsored by SPIE Europe ; cooperating organisations, NASA--National Aeronautics and Space Administration (USA), [and] EOS--European Optical Society
Date
[2006]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 6362
Si Chee Tsay, Tatsuya Yokota, Myoung-Hwan Ahn, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NASA--National Aeronautics and Space Administration (USA) ... [and others]
Date
[2004]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5652
World Meteorological Organization, National Aeronautics and Space Administration, Federal Aviation Administration, National Oceanic and Atmospheric Administration
Date
1982
Series
WMO Global Ozone Research and Monitoring Project report ; no. 11
sponsored by the National Aeronautics and Space Administration and the American Geophysical Union in cooperation with Special Study Group 2.51 of the International Association of Geodesy and held at the Massachusetts Institute of Technology, Cambridge, Massachusetts, and the Northeast Radio Observatory Corporation Haystack Observatory, Westford, Massachusetts, June 19-21, 1979
Allen M. Larar, Makoto Suzuki, Qingxi Tong, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NASA--National Aeronautics and Space Administration (USA) ... [and others]
Date
[2005]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5655
W. Paul Menzel, Toshiki Iwasaki, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NASA--National Aeronautics and Space Administration (USA) ... [and others]
Date
[2005]
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5658