Proceedings / SPIE--the International Society for Optical Engineering Automated optical inspection for industry: theory, technology, and applications II
Lionel R. Baker, H. John Caulfield, chairs/editors ; organized by Sira Ltd.--the Research Association for Instrumentation, SPIE--the International Society for Optical Engineering, ANRT--Association nationale de la recherche technique (France) ; sponsored by Sira Ltd.--the Research Association for Instrumentation
Date
1986
Series
Proceedings / SPIE Automatic optical inspection
Proceedings of SPIE--the International Society for Optical Engineering; 654