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Advances and applications in the metallography and characterization of materials and microelectronic components : proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society
- Author / Creator
- Available as
- Physical
Details
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- Creator
- edited by D.W. Stevens ... [and others]
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- Columbus, Ohio : International Metallographic Society ; Materials Park, Ohio : ASM International, [1996]
- ©1996
- Physical Details
-
- xi, 318 pages : illustrations ; 29 cm
- ISBNs
- 9780871705709, 0871705702
- OCLC
- ocm35138770
- Meeting held in Albuquerque, New Mexico, July 23-26, 1995.
- Includes bibliographical references.