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Forensic evidence analysis and crime scene investigation : 20-21 November, 1996, Boston, Massachusetts
- Available as
- Physical
Details
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- Creator
- John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by, National Institute of Standards and Technology ... [and others] ; cooperating organizations, National Institute of Justice ... [and others]
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- Bellingham, Wash., USA : SPIE, [1997]
- ©1997
- Physical Details
-
- v, 148 pages : illustrations ; 28 cm
- ISBNs
- 9780819423436, 0819423432
- OCLC
- ocm36415936
- Includes bibliographic references and author index.