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Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
- Author / Creator
- Conferences
- IEEE International Workshop on Memory Technology, Design, and Testing (1995 : San Jose, Calif.)
- Available as
- Online
- Physical
Details
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- Creator
- edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council
- Included Title
-
- IEEE Xplore conferences
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- Los Alamitos, Calif. : IEEE Computer Society Press, [1995]
- ©1995
- Physical Details
-
- ix, 129 pages : illustrations ; 28 cm
- ISBNs
- 0818671025, 9780818671029
- OCLC
- ocm33418600
- "IEEE catalog number 95TH8065"--T.p. verso.
- Includes bibliographical references and index.
- Also available in electronic format on the World Wide Web.