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IEEE standard test procedures for semiconductor charged-particle detectors
- Author / Creator
- Available as
- Physical
Details
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- Creator
- sponsor, Nuclear Instruments and Detectors Committee of the IEEE Nuclear and Plasma Sciences Society
- Included Titles
-
- IEEE Xplore standards
- Semiconductor charged-particle detectors
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- New York : The Institute, [1988]
- ©1988
- Series
- Physical Details
-
- 27 pages : illustrations ; 28 cm
- OCLC
- ocm22221171
- Revision of ANSI/IEEE Std 300-1982.
- Approved June 9, 1988, IEEE Standards Board.
- Also available on the Internet.