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Proceedings
- Author / Creator
- Conferences
- IEEE VLSI Test Symposium (12th : 1994 : Cherry Hill, N.J.)
- Available as
- Physical
Details
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- Creator
- 12th IEEE VLSI Test Symposium, April 25-28, 1994, Cherry Hill, New Jersey ; sponsored by IEEE Computer Society Technical Committee on Test Technology [and the] IEEE Philadelphia Section
- Included Title
-
- IEEE Xplore conferences
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- Los Alamitos, Calif. : IEEE Computer Society Press, [1994]
- ©1994
- Physical Details
-
- xviii, 466 pages : illustrations ; 28 cm
- ISBNs
- 9780818654404, 0818654406, 0818654418
- OCLC
- ocm30757751
- "IEEE Computer Society Press Order Number 5440-02"--P. [iv].
- "IEEE Catalog Number 94TH0645-2"--P. [iv].
- Includes bibliographical references and index.
- Also available in electronic format on the World Wide Web.