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Books
Special issue on current measurement
- Conferences
- IEEE Working Conference on Current Measurement (4th : 1990 : Clinton, Md.)
- Available as
- Online
- Physical
Details
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- Included Titles
-
- IEEE Xplore
- IEEE Xplore journals
- Current measurement
- Format
- Books
- Language
- English
- Publication
-
- New York, NY : IEEE, 1991
- Physical Details
-
- pages 305-438 : illustrations ; 28 cm
- OCLC
- ocm35508129
- "Based on presentations from the IEEE Fourth Working Conference on Current Measurement ... held in April 1990 in Clinton, MD"--Guest editorial.
- Cover title.
- Also available in electronic format via the World Wide Web.