xii, 285 pages : illustrations (some color) ; 26 cm
ISBNs
9780306424663, 0306424665
OCLC
ocm14376950
"Proceedings of a symposium ... part of the Electron Microscopy Society of America/Microbeam Analysis Society joint annual meeting, held August 5-9, 1985, in Louisville, Kentucky"--T.p. verso.