Website Search
Find information on spaces, staff, and services.
Catalog Search
Journals, Magazines, Newspapers
Proceedings of the ... IEEE International Conference on Microelectronic Test Structures
- Author / Creator
- Conferences
- IEEE International Conference on Microelectronic Test Structures
- Available as
- Online
- Physical
Details
Checking for availability...
- Included Title
-
- IEEE Xplore conferences
- Format
- Journals, Magazines, Newspapers
- Language
- English
- Contributors
- Publication
-
- New York, N.Y. : Institute of Electrical and Electronics Engineers, 1986 [that is, 1988]-
- Publication Dates
- 1988-
- Physical Details
-
- volumes : illustrations ; 28 cm
- OCLC
- ocm17980589
- Also available in electronic format on the World Wide Web.