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Books
Special section on ICMTS'96
- Conferences
- IEEE International Conference on Microelectronic Test Structures (1996 : Trento, Italy)
- Available as
- Online
Details
- Creator
- [editor] G. Cheek [guest editors] K. O. Jeppson, and A. J. Walton
- Included Title
-
- IEEE Xplore
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- New York, NY : Institute of Electrical and Electronics Engineers, c1997
- Physical Details
-
- p. 193-324 : ill. ; 28 cm
- Includes bibliographical references.
- Also available in electronic format on the World Wide Web.