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International Test Conference : special issue

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International Test Conference : special issue

Conferences: International Test Conference (12th : 1981 : Philadelphia, Pa.)
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Creator: guest editor Louis J. Sobotka
Format: Books
Language: English
Contributors: Sobotka, Louis J

IEEE Computer Society. Test Technology Committee

Institute of Electrical and Electronics Engineers. Philadelphia Section
Publication: Potomac, Md. : Computer Science Press, 1982
Series: Journal of digital systems, v. 6, no. 2/3 (Summer/Fall 1982)
Physical Details: p. 103-288 : ill. ; 23 cm

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Integrated circuits -- Testing -- Congresses.
Electronic digital computers -- Circuits -- Testing -- Congresses.
Automatic test equipment -- Congresses.

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