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Spectroscopic characterization techniques for semiconductor technology II : 1985 Los Angeles technical symposium : 21-25 January 1985, Los Angeles, United States
- Available as
- Online
Details
- Creator
- editors, Fred H. Pollak, Raphael Tsu ; sponsored by SPIE
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- Bellingham, Washington : SPIE, 1985
- Physical Details
-
- 1 online resource (vi, 169 pages)
- ISBNs
- 0892525592, 9780892525591
- OCLC
- ocm12307424