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Microbeam and Nanobeam Analysis
- Available as
- Online
Details
- Creator
- edited by Daniele Benoit, Jean-Francois Bresse, Luc Van't dack, Helmut Werner, Johann Wernisch
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- 1st ed. 1996
- Vienna : Springer Vienna : Imprint: Springer, 1996
- Physical Details
-
- 1 online resource (XI, 643 pages 98 illustrations, 4 illustrations in color)
- text file PDF
- ISBNs
- 9783709165553, 9783211828748, 9783709165560
- OCLC
- ocn851391384
- Monte Carlo Simulation Techniques for Quantitative X-Ray Microanalysis -- Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications -- Use of Soft X-Rays in Microanalysis -- Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region -- Synchrotron Radiation Induced X-ray Microfluorescence Analysis -- Particle-Induced X-Ray Emission - A Quantitative Technique Suitable for Microanalysis -- Cathodoluminescence Microscopy and Spectroscopy of Semiconductors and Wide Bandgap Insulating Materials -- Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) -- Three-Dimensional Nanoanalysis with the Tomographic Atom-Probe -- Microanalysis at Atomic Resolution -- Composition of Vanadium Carbides Formed by Solidification in Fe-V-C-M Alloys: Influence of Additions (M = Al, Cu, Mo) -- Electron Transmission Coefficient for Oblique Angle of Incidence -- Depth Distribution Function for Oblique Angle of Incidence -- Simulation of EDS Spectra Using X-RES Software -- On the Use of the GeL? Line in Thin Film X-Ray Microanalysis of Si1-x Gex/Si Heterostructures -- Computer Simulations of the X-Ray Intensity Distribution from Submicron Particles Embedded in a Matrix -- Determination of Rare Earth Elements in Biological and Mineral Apatite by EPMA and LAMP-ICP-MS -- Quantitative Analysis of the Compound Layer of Plasma Nitrided Pure Iron -- Correction of the Edge Effect in Auger Electron Microscopy -- Low Energy Imaging of Nonconductive Surfaces in SEM -- Investigation of the Bonding Mechanism of Glass Ceramic Layers on Metal Alloys -- Monte Carlo Method for Quantitative Analysis of Bulk and Layered Samples -- SIMS Linescan Profiling of Chemically Bevelled Semiconductors: a Method of Overcoming Ion Beam Induced Segregation in Depth Profiling -- Experimental Verification of Theoretical Models Simulating the Temperature Increase in EPMA of Glass -- Quantitation of Mineral Elements of Different Fruit Pollen Grains -- Electron Beam Induced Migration of Alkaline Ions in Silica Glass -- Application of the Boltzmann Transport Equation in the Thickness Determination of Thin Films -- Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images -- Calculation of the Surface Ionisation Using Analytical Models of Electron Backscattering -- Thickness Determination of Thin Insulating Layers -- High Energy and Angular Resolution Dynamic Secondary Ion Mass Spectrometry -- EPMA and Mass Spectrometry of Soil and Grass Containing Radioactivity from the Nuclear Accident at Chernobyl -- Application of a New Monte Carlo Simulation Algorithm to Electron Probe Microanalysis -- Topography Development on Single Crystal MgO Under Ion Beam Bombardment -- Determination of SPM TIP Shape Using Polystyrene Latex Balls -- Combined Characterization of Nanostructures by AEM and STM -- Study of Quasi-Fractal Many-Particle-Systems and Percolation Networks by Zero-Loss Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Digital Image Analysis -- Calculation of Bremsstrahlung Spectra for Multilayer Samples -- Thickness Measurement of Thin Films by EPMA - Influence of ? (0), MAC's and Substrate -- A Simple Procedure to Check the Spectral Response of an EDX Detector -- Virtual WDS -- Monte Carlo Simulation Program with a Free Configuration of Specimen and Detector Geometries -- Barriers to Energy Dispersive Spectrometry with Low Energy X-Rays -- Measurements of Ga1-xAlxAs Layers on GaAs with EDS -- The Relative Intensity Factor for La Radiation Considering the Different Mass Absorption of La and L? Radiation -- Determination of the Solubility of Cerium in BaTiO3 by Quantitative WDS Electron Probe Microanalysis -- Simulation of X-Ray Diffraction Profiles of Gradually Relaxed Epilayers -- Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization -- Chemical-Bond Characterization of Nanostructures by EELS -- Local Determination of Carbon by Combining Beta-Autoradiography and Electron Microprobe Analysis -- The Check of the Elastic Scattering Model in Monte-Carlo Simulation -- True Colour X-Ray Vision for Electron Microscopy and Microanalysis -- Determination of the Oxidation States of Nb by Auger Electron Spectroscopy -- Study by SIMS of the 54Cr and 18O Diffusion in Cr2 O3 and in Cr2O3 Scales -- Comparison of Back-Foil Scanning X-Ray Microfluorescence and Electron Probe X-Ray Microanalysis for the Elemental Characterisation of Thin Coatings -- Electron Probe X-Ray Microanalysis of Coatings -- Analysis of Layers: X-Ray Maps of Change in Thickness Obtained by Electron Macroprobe -- Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Siin Absolute Units -- Practical Aspects and Applications of EPMA at Low Electron Energies -- Oxidation and Reduction Processes of Be/BeO Induced by Electrons