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Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test
- Author / Creator
- Conferences
- International Symposium on VLSI Design, Automation, and Test
- Available as
- Online
Details
- Other Titles
-
- Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation & Test
- VLSI-DAT ..
- International Symposium on VLSI Design, Automation & Test
- First issue has title: IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT)
- Included Title
-
- IEEE/IET Electronic Library (IEL)
- Format
- Journals, Magazines, Newspapers
- Language
- English
- Publication
-
- Piscataway, NJ : IEEE
- Publication Dates
- Began with: 2005
- ISSNs
- 2472-9124
- OCLC
- ocn946612907