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SIGMETRICS 2005 : International Conference on Measurement and Modeling of Computer Systems : proceedings : June 6-10, 2005, Banff, Alberta, Canada
- Author / Creator
- Conferences
- International Conference on Measurement and Modeling of Computer Systems (2005 : Banff, Alberta, Canada)
- Available as
- Physical
Details
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- Creator
- sponsored by ACM Sigmetrics
- Other Titles
-
- Proceedings, ACM SIGMETRICS 2005
- Also known as: SIGMETRICS '05
- Included Title
-
- ACM Digital Library conferences
- Format
- Books
- Language
- English
- Contributors
- Publication
-
- New York, N.Y. : Association for Computing Machinery, [2005]
- ©2005
- Series
- Physical Details
-
- xi, 415 pages : illustrations ; 28 cm
- ISBNs
- 9781595930224, 1595930221
- OCLC
- ocm60755734
- "Special issue."
- "ACM order number 488040"--T.p. verso.
- Includes bibliographical references and author index.
- Also issued online via the ACM Digital Library with title: Proceedings of the 2005 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems.